eMMC100 Aging Burn-in Test Socket with USB Interface for BGA100 to USB

eMMC100 Aging Burn-in Test Socket with USB Interface for BGA100 to USB

Features:

• Product use: Programming block, test block, test, read and write to EMMC100 IC chips

• ITE IT1327 main control chip, built-in SD/MMC card power supply, integrated 5V to the 3.3V voltage regulator, high-speed USB 2.0 interface, backward compatible with USB 1.1

• Integrated USB 2.0 Transceiver Macro Unit Interface (UTMI) and Serial Interface Engine (SIE)

• Supports bus power mode

• Supports hot-plugging and individual switching of the power supply, supports testing via the USB interface or by connecting a cable to the corresponding PIN on the board

• Floating board structure for precise positioning, easy access to ICs, and higher efficiency

• Apply to eMMC of Samsung, Sandis k, Toshiba, Hynix, and Intel.

• With 88pins and pin pitch 1.0mm, eMMC size 12x18mm, we also provide another type of size 14x18mm

• Apply to eMMC thickness of 0.6mm to 2.0mm.

• The test can be carried out with or without balls.

• This product applies to BGA 100

• Easy operation by inserting USB into your PC directly

Package includes:

• 1 x Test Socket