Fnirsi DSO-TC4 Portable 3-in-1 Digital Transistor Tester & Oscilloscope & Signal Generator

Fnirsi DSO-TC4 Portable 3-in-1 Digital Transistor Tester & Oscilloscope & Signal Generator
Features:

• It integrates an oscilloscope, a signal generator, and a transistor tester

• Oscilloscope functions: Sampling rate: 48MSa/s; Analog bandwidth: 10MHz; Voltage protection: ±400V

• Waveform storage: supports screenshot saving and viewing, which is convenient for data analysis

• Signal generator function: Supports 13 waveform outputs, frequency range 0-50KHz, output voltage adjustable 0-3V

• Output parameters (frequency, amplitude, duty cycle) are adjustable, flexible to meet various needs

• Transistor function: Automatically identify the type and pin arrangement of the tested component, simplify the operation process, and improve test efficiency

• Diverse categories: Detect and analyze the performance and characteristics of semiconductor components such as transistors, diodes, triodes, field effect (FET), etc

• Equipped with a 2.8-inch TFT color screen, the picture is clear and intuitive

• Built-in high-capacity rechargeable lithium battery (1500mAh), standby time 4 hours

• Small and light, suitable for mobile use

Specification:

• Brand: FNIRSI

• Model: DSO-TC4

• Screen: 2.8-inch TFT Color Screen

• Backlight: Brightness Adjustable

• Power Supply: Type-C（5V/1A）

• Battery: 3.7V/1500mAh

• Languages: 中文、English、Deutsch、Português、にほんご、Español、한국인、Pyccкий

• Size: 90*142*27.5mm

• Product Weight: 186g

Oscilloscope:

• Real-Time Sampling Rate: 48MSa/s

• Analog Bandwidth: 10MHz

• Input Impedance: 1MΩ

• Coupling Mode: AC/DC

• Test Voltage Range: 1:1 Probe: 80Vpp (+40V); 10:1 Probe: 800Vpp (+400V)

• Vertical Sensitivity: 10mV/div~10V/div (X1 range)

• Vertical Displacement: Adjustable with indication

• Time Base Range: 50ns~20s

• Trigger Mode: Auto/Normal/Single

• Trigger Type: Rising edge, Falling edge

• Trigger Level: Adjustable with indication

• Waveform Freeze: Yes (HOLD function)

• Automatic Measurement: Max, Min, Avg, RMS, Vpp, Frequency, Cycle, Duty Cycle

Component Testing:

• Transistor: Amplification factor "hfe"; Base-Emitter voltage "Ube", Ic/Ie, Collector-Emitter reverse leakage current "Iceo", Ices, Forward voltage drop of protection diode "Uf"

• Diode: Forward voltage drop <5V (Forward voltage drop, Junction capacitance, Reverse leakage current)

• Zener Diode: 0.01~4.5V (1-2-3 test zone) Forward voltage drop

• JFET: Gate capacitance "Cg", Drain current Id under "Vgs", Forward voltage drop of protection diode "Uf"

• IGBT: Drain current Id under Vgs, Forward voltage drop of protection diode Uf

• MIOSTET: Threshold voltage "Vt", Gate capacitance "Cg", Drain-Source resistance "Rds", Forward voltage drop of protection diode "Uf"

• Unidirectional SCR: Trigger voltage <5V, Gate level

• Bidirectional SCR: Trigger current <6mA

• Capacitor: 25pF~1000μF, Loss factor "Vloss"

• Resistor: 0.01Ω~50MΩ

• Inductor: 10μH~1000μH, DC resistance

• DS18B20: Temperature sensor, Pins: GND, DQ, VDD

• DHT11: Temperature and humidity sensor, Pins: VDD, DATA, GND

Signal Generator: 

• Output Waveform: Supports 13 waveform outputs

• Waveform Frequency: 0~50KHz

• Square Wave Duty Cycle: 0~100%

• Waveform Amplitude: 0.1V~3.0V

Package includes:

• 1 x Host

• 1 x P6100 High Voltage Probe

• 1 x Adapter

• 1 x Type-C Charging Cable

• 3 x Test Hook

• 1 x Ordinary Probe