SM2256K Main Control Board BGA152 Flip-top Type SSD Test Burn-in Stand for Test SSD Chips Open Card

SM2256K Main Control Board BGA152 Flip-top Type SSD Test Burn-in Stand for Test SSD Chips Open Card

Features:

• The flip-top shrapnel test holder is a low-cost solution developed for the FLASH industry. The flip-top operation is easy to remove and replace the chips and reduces the harm to the test staff when testing in large quantities

• The product adopts the bow-shaped shrapnel structure, this structure coupled with the imported beryllium copper gold plating has good stretching performance, a special crescent-shaped needle, that can be tested with or without ball residual ball

• It can test all kinds of packages of FLASH BGA100/132/TSOP48/LGA etc. to DIP48 test holders and can be replaced at will

• Product use: Programming holders, test holders, testing and reading data for BGA152 IC chips

• Applicable packages: BGA152/BGA132; pin pitch 1.0mm

• Test holder: BGA152/132-1.0

• Special note: temporarily only TLC grade FLASH can be supported, support for chips below 4CE

Package includes:

• 1 x Test Burn-in Stand